2.2.8 DFT interface

The CCI-550 incorporates testing interfaces.

For in-silicon testing of logic and RAMs, the CCI-550 includes DFT and MBIST interfaces.
Related reference
A.6 DFT signals
Non-ConfidentialPDF file icon PDF versionARM 100282_0100_00_en
Copyright © 2015, 2016 ARM. All rights reserved.