Debugging High Performance Embedded Memories

Research paper

Embedded memories fail because of defects, process variation and design marginality. Finding root cause requires a solid design methodology, the correct design-for-debug features, and a structured debug process. This paper/presentation will show some proven techniques for doing this.

This document is only available in a PDF version.

Copyright © 2009 ARM Limited. All rights reserved. ARM ARP0020A
Non-Confidential