Design for Manufacturability

Research paper

Design for manufacturability (DFM) has always been important but is vital as we move to 90-nanometer technologies, and it requires the efforts of design, test, and yield engineering. Historically, test engineering has been concerned with identifying defects before shipment, while yield engineering has been concerned with preventing defects from happening in the first place. With 130 nm, the line between defects and process variation has blurred to the point that in some cases it is no longer meaningful. This means that yield and quality level are becoming more design dependent than ever, and that test effectiveness cannot be guaranteed without strict DFM guidelines. Without DFM, no company will be able to successfully make the jump to 90-nm technology. The panelists explore DFM from a variety of perspectives. IEEE Design and Test thanks the roundtable participants: moderator Rob Aitken (Artisan Components), Stefan Eichenberger (Philips Semiconductors), Sandip Kundu (Intel), Gary Maier (IBM), and Hank Walker (Texas A&M University). D&T gratefully acknowledges the help of Kaushik Roy (Purdue University), our Roundtables Editor, who organized the event. Special thanks go to the IEEE Computer Society for sponsoring the roundtable.

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