The Design and Validation of IP for DFM/DFY Assurance

Research paper

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Design for Manufacturability (DFM) is becoming increasingly important as process geometries shrink. The System-on-Chip business model requires high quality, high yielding IP. This paper shows how DFM and DFY are integrated as part of IP delivery, using a set of metrics to identify and fix yield limiters without compromising power, area or performance.

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