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There are six test data registers that can connect between DBGTDI and DBGTDO:
bypass register
id code register
instruction register
scan path select register
scan chain 1
scan chain 2.
In the following descriptions, data is shifted during every CLK cycle when DBGTCKEN enable is HIGH.
| Copyright © ARM Limited 1998-2000. All rights reserved. | ARM DDI 0084F |
| Non-Confidential | |
| PDF version | |
| Home > Debug in Depth > Test data registers |