4.2. Scan testing

The SCI peripheral has been designed to simplify the insertion of scan test cells and the use of Automatic Test Pattern Generation (ATPG) for an alternative method of manufacturing test.

During scan testing, the SCANMODE input must be driven HIGH to ensure that all internal data storage elements can be asynchronously reset. For normal use and application of manufacturing test vectors via the TIC, SCANMODE must be negated LOW.

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