10.2. Scan insertion and ATPG

This technique is covered in detail in the ARM946E-S Implementation Guide. Scan insertion requires that all register elements are replaced by scannable versions that are then connected up into a number of large scan chains. These scan chains are used to set up data patterns on the combinatorial logic between the registers, and capture the logic outputs. The logic outputs are then scanned out while the next data pattern is scanned in.

You can use Automatic Test Pattern Generation (ATPG) tools to create the necessary scan patterns to test the logic, when the scan insertion has been performed. With this technique you can achieve very high fault coverage for the standard cell combinatorial logic, typically in the 95-99% range.

Scan insertion does have an impact on the area and performance of the synthesized design, due to the larger scan register elements and the serial routing between them. However, to minimize these effects, the scan insertion is performed early in the synthesis cycle and the design re-optimized with the scan elements in place.

Copyright © 2000 ARM Limited. All rights reserved.ARM DDI 0155A