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| Home > Programmer’s Model for Test > Test register descriptions > Integration Test Output Register 1, CLCDITOP1 | |||
CLCDITOP1 is one of two Integration Test Output Registers. If the CLCDTCR[0] ITEN bit is high then the CLCDITOP1 register value is used, otherwise the functional mode value is driven onto the intra-chip output port. The register bit assignments are listed in Table 4.3.
Table 4.3. CLCDITOP1 bit assignments
| Bit | Name | Type | Description |
|---|---|---|---|
| [31:6] | - | - | Reserved, do not modify, write as zero |
| [5] | CLCDCLKSEL | Read/write | Intra-chip output. Writes specify the value to be driven on the CLCDCLKSEL line when in integration test mode. A read returns the value of the CLCDCLKSEL signal at the output of the test multiplexor. |
| [4] | CLCDMBEINTR | Read/write | Intra-chip output. Writes specify the value to be driven on the CLCDMBEINTR line when in integration test mode. A read returns the value of the CLCDMBEINTR signal at the output of the test multiplexor. |
| [3] | CLCDFUFINTR | Read/write | Intra-chip output. Writes specify the value to be driven on the CLCDFUFINTR line when in integration test mode. A read returns the value of the CLCDFUFINTR signal at the output of the test multiplexor. |
| [2] | CLCDLNBUINTR | Read/write | Intra-chip output. Writes specify the value to be driven on the CLCDLNBUINTR line when in integration test mode. A read returns the value of the CLCDLNBUINTR signal at the output of the test multiplexor. |
| [1] | CLCDVCOMPINTR | Read/write | Intra-chip output. Writes specify the value to be driven on the CLCDVCOMPINTR line when in integration test mode. A read returns the value of the CLCDVCOMPINTR signal at the output of the test multiplexor. |
| [0] | CLCDINTR | Read/write | Intra-chip output. Writes specify the value to be driven on the CLCDINTR line when in integration test mode. A read returns the value of the CLCDINTR signal at the output of the test multiplexor. |