4.3.2. Integration Test Output Register 1, CLCDITOP1

CLCDITOP1 is one of two Integration Test Output Registers. If the CLCDTCR[0] ITEN bit is high then the CLCDITOP1 register value is used, otherwise the functional mode value is driven onto the intra-chip output port. The register bit assignments are listed in Table 4.3.

Table 4.3. CLCDITOP1 bit assignments

BitNameTypeDescription
[31:6]--Reserved, do not modify, write as zero
[5]CLCDCLKSEL

Read/write

Intra-chip output. Writes specify the value to be driven on the CLCDCLKSEL line when in integration test mode.

A read returns the value of the CLCDCLKSEL signal at the output of the test multiplexor.

[4]CLCDMBEINTR

Read/write

Intra-chip output. Writes specify the value to be driven on the CLCDMBEINTR line when in integration test mode.

A read returns the value of the CLCDMBEINTR signal at the output of the test multiplexor.

[3]CLCDFUFINTR

Read/write

Intra-chip output. Writes specify the value to be driven on the CLCDFUFINTR line when in integration test mode.

A read returns the value of the CLCDFUFINTR signal at the output of the test multiplexor.

[2]CLCDLNBUINTR

Read/write

Intra-chip output. Writes specify the value to be driven on the CLCDLNBUINTR line when in integration test mode.

A read returns the value of the CLCDLNBUINTR signal at the output of the test multiplexor.

[1]CLCDVCOMPINTR

Read/write

Intra-chip output. Writes specify the value to be driven on the CLCDVCOMPINTR line when in integration test mode.

A read returns the value of the CLCDVCOMPINTR signal at the output of the test multiplexor.

[0]CLCDINTR

Read/write

Intra-chip output. Writes specify the value to be driven on the CLCDINTR line when in integration test mode.

A read returns the value of the CLCDINTR signal at the output of the test multiplexor.

Copyright © 1999-2003 ARM Limited. All rights reserved.ARM DDI 0161E
Non-Confidential