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| Home > Programmer’s Model for Test > VIC test harness overview | |||
The additional logic for functional verification and production testing enables:
capture of input signals to the block
stimulation of the output signals.
The integration vectors provide a way of verifying that the VIC is correctly wired into a system. Do this by separately testing two groups of signals:
Test these by checking the connections of all the address and data bits.
The tests for these signals are system-specific, and enable you to write the necessary tests. Additional logic is implemented enabling you to read/write to each intra-chip input/output signal.
Test registers control these test features, and enable you to test the VIC in isolation from the rest of the system using only transfers from the AMBA AHB.
Off-chip test vectors are supplied using a 32-bit parallel External Bus Interface (EBI) and converted to internal AMBA bus transfers. The Test Interface Controller (TIC) AMBA bus master module controls the application of test vectors.