ARM7TDMI Technical Reference ManualRevision: r4p1
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ARM7TDMI Technical Reference Manual

Revision: r4p1

Copyright © 2001, 2004 ARM Limited. All rights reserved.

Proprietary notices

Table of Contents

Preface
About this manual
Product revision status
Intended audience
Using this manual
Conventions
Further reading
Feedback
Feedback on this product
Feedback on this manual
1. Introduction
1.1. About the ARM7TDMI core
1.1.1. The instruction pipeline
1.1.2. Memory access
1.1.3. Memory interface
1.1.4. EmbeddedICE-RT logic
1.2. Architecture
1.2.1. Instruction compression
1.2.2. The Thumb instruction set
1.3. Block, core, and functional diagrams
1.4. Instruction set summary
1.4.1. Format summary
1.4.2. ARM instruction summary
1.4.3. Thumb instruction summary
2. Programmer’s Model
2.1. About the programmer’s model
2.2. Processor operating states
2.2.1. Switching state
2.3. Memory formats
2.3.1. Little-endian
2.3.2. Big-endian
2.4. Data types
2.5. Operating modes
2.6. Registers
2.6.1. The ARM-state register set
2.6.2. The Thumb-state register set
2.6.3. The relationship between ARM-state and Thumb-state registers
2.6.4. Accessing high registers in Thumb state
2.7. The program status registers
2.7.1. Condition code flags
2.7.2. Control bits
2.7.3. Reserved bits
2.8. Exceptions
2.8.1. Exception entry and exit summary
2.8.2. Entering an exception
2.8.3. Leaving an exception
2.8.4. Fast interrupt request
2.8.5. Interrupt request
2.8.6. Abort
2.8.7. Software interrupt instruction
2.8.8. Undefined instruction
2.8.9. Exception vectors
2.8.10. Exception priorities
2.9. Interrupt latencies
2.9.1. Maximum interrupt latencies
2.9.2. Minimum interrupt latencies
2.10. Reset
3. Memory Interface
3.1. About the memory interface
3.2. Bus interface signals
3.3. Bus cycle types
3.3.1. Nonsequential cycles
3.3.2. Sequential cycles
3.3.3. Internal cycles
3.3.4. Merged IS cycles
3.3.5. Coprocessor register transfer cycles
3.3.6. Summary of ARM memory cycle timing
3.4. Addressing signals
3.4.1. A[31:0]
3.4.2. nRW
3.4.3. MAS[1:0]
3.4.4. nOPC
3.4.5. nTRANS
3.4.6. LOCK
3.4.7. TBIT
3.5. Address timing
3.6. Data timed signals
3.6.1. D[31:0], DOUT[31:0], and DIN[31:0]
3.6.2. ABORT
3.6.3. Byte latch enables
3.6.4. Byte and halfword accesses
3.7. Stretching access times
3.7.1. Modulating MCLK
3.7.2. Use of nWAIT to control bus cycles
3.8. Privileged mode access
3.9. Reset sequence after power up
4. Coprocessor Interface
4.1. About coprocessors
4.1.1. Coprocessor availability
4.2. Coprocessor interface signals
4.3. Pipeline following signals
4.4. Coprocessor interface handshaking
4.4.1. The coprocessor
4.4.2. The ARM7TDMI processor
4.4.3. Coprocessor signaling
4.4.4. Consequences of busy-waiting
4.4.5. Coprocessor register transfer instructions
4.4.6. Coprocessor data operations
4.4.7. Coprocessor load and store operations
4.5. Connecting coprocessors
4.5.1. Connecting a single coprocessor
4.5.2. Connecting multiple coprocessors
4.6. If you are not using an external coprocessor
4.7. Undefined instructions
4.8. Privileged instructions
5. Debug Interface
5.1. About the debug interface
5.1.1. Stages of debug
5.1.2. Clocks
5.2. Debug systems
5.2.1. Debug host
5.2.2. Protocol converter
5.2.3. Debug target
5.3. Debug interface signals
5.3.1. Entry into debug state
5.3.2. Action of the ARM7TDMI processor in debug state
5.3.3. Action of the ARM7TDMI core in monitor mode
5.4. ARM7TDMI core clock domains
5.4.1. Clock switch during debug
5.4.2. Clock switch during test
5.5. Determining the core and system state
5.6. About EmbeddedICE-RT logic
5.7. Disabling EmbeddedICE-RT
5.8. Debug Communications Channel
5.8.1. DCC control register
5.8.2. Communications through the DCC
5.9. Monitor mode
6. Instruction Cycle Timings
6.1. About the instruction cycle timing tables
6.2. Branch and branch with link
6.3. Thumb branch with link
6.4. Branch and Exchange
6.5. Data operations
6.6. Multiply and multiply accumulate
6.7. Load register
6.8. Store register
6.9. Load multiple registers
6.10. Store multiple registers
6.11. Data swap
6.12. Software interrupt and exception entry
6.13. Coprocessor data operation
6.14. Coprocessor data transfer from memory to coprocessor
6.15. Coprocessor data transfer from coprocessor to memory
6.16. Coprocessor register transfer, load from coprocessor
6.17. Coprocessor register transfer, store to coprocessor
6.18. Undefined instructions and coprocessor absent
6.19. Unexecuted instructions
6.20. Instruction speed summary
7. AC and DC Parameters
7.1. Timing diagrams
7.2. Notes on AC parameters
7.3. DC parameters
A. Signal and Transistor Descriptions
A.1. Transistor dimensions
A.2. Signal types
A.3. Signal descriptions
B. Debug in Depth
B.1. Scan chains and the JTAG interface
B.1.1. Scan chain implementation
B.1.2. TAP state machine
B.2. Resetting the TAP controller
B.3. Pullup resistors
B.4. Instruction register
B.5. Public instructions
B.5.1. EXTEST (b0000)
B.5.2. SCAN_N (b0010)
B.5.3. SAMPLE/PRELOAD (b0011)
B.5.4. RESTART (b0100)
B.5.5. CLAMP (b0101)
B.5.6. HIGHZ (b0111)
B.5.7. CLAMPZ (b1001)
B.5.8. INTEST (b1100)
B.5.9. IDCODE (b1110)
B.5.10. BYPASS (b1111)
B.6. Test data registers
B.6.1. Bypass register
B.6.2. ARM7TDMI core device IDentification (ID) code register
B.6.3. Instruction register
B.6.4. Scan path select register
B.6.5. Scan chains 0, 1, 2, and 3
B.7. The ARM7TDMI core clocks
B.7.1. Clock switch during debug
B.7.2. Clock switch during test
B.8. Determining the core and system state in debug state
B.8.1. Determining the core state
B.8.2. Determining system state
B.8.3. Exit from debug state
B.9. Behavior of the program counter in debug state
B.9.1. Software breakpoints
B.9.2. Watchpoints
B.9.3. Watchpoint with another exception
B.9.4. Debug request
B.9.5. System speed access
B.9.6. Summary of return address calculations
B.10. Priorities and exceptions
B.10.1. Breakpoint with Prefetch Abort
B.10.2. Interrupts
B.10.3. Data Aborts
B.11. Scan chain cell data
B.11.1. Scan chain 0 cells
B.11.2. Scan chain 1 cells
B.12. The watchpoint registers
B.12.1. Programming and reading watchpoint registers
B.12.2. Using the mask registers
B.12.3. The control registers
B.13. Programming breakpoints
B.13.1. Hardware breakpoints
B.13.2. Software breakpoints
B.14. Programming watchpoints
B.15. The debug control register
B.15.1. Disabling EmbeddedICE-RT
B.15.2. Disabling interrupts
B.15.3. Forcing DBGRQ
B.15.4. Forcing DBGACK
B.16. The debug status register
B.17. The abort status register
B.18. Coupling breakpoints and watchpoints
B.18.1. Breakpoint and watchpoint coupling example
B.18.2. RANGEOUT signal
B.19. EmbeddedICE-RT timing
B.20. Programming restriction
C. Differences Between Rev 3a and Rev 4
C.1. Summary of differences between Rev 3a and Rev 4
C.2. Detailed descriptions of differences between Rev 3a and Rev 4
C.2.1. Improved low voltage operation
C.2.2. Addition of EmbeddedICE-RT logic
C.2.3. Enhancement to ETM interface
C.2.4. Improvement in Debug Communications Channel bandwidth
C.2.5. Access to Debug Communications Channel through JTAG
C.2.6. Alterations to TAP controller scan chain
C.2.7. Change to pin positioning
C.2.8. Increased number of metal layers
C.2.9. Increased power consumption
Glossary

List of Figures

1. Key to timing diagram conventions
1.1. Instruction pipeline
1.2. ARM7TDMI processor block diagram
1.3. ARM7TDMI main processor logic
1.4. ARM7TDMI processor functional diagram
1.5. ARM instruction set formats
1.6. Thumb instruction set formats
2.1. LIttle-endian addresses of bytes and halfwords within words
2.2. Big-endian addresses of bytes and halfwords within words
2.3. Register organization in ARM state
2.4. Register organization in Thumb state
2.5. Mapping of Thumb-state registers onto ARM-state registers
2.6. Program status register format
3.1. Simple memory cycle
3.2. Nonsequential memory cycle
3.3. Sequential access cycles
3.4. Internal cycles
3.5. Merged IS cycle
3.6. Coprocessor register transfer cycles
3.7. Memory cycle timing
3.8. Pipelined addresses
3.9. Depipelined addresses
3.10. SRAM compatible address timing
3.11. External bus arrangement
3.12. Bidirectional bus timing
3.13. Unidirectional bus timing
3.14. External connection of unidirectional buses
3.15. Data write bus cycle
3.16. Data bus control circuit
3.17. Test chip data bus circuit
3.18. Memory access
3.19. Two-cycle memory access
3.20. Data replication
3.21. Typical system timing
3.22. Reset sequence
4.1. Coprocessor busy-wait sequence
4.2. Coprocessor register transfer sequence
4.3. Coprocessor data operation sequence
4.4. Coprocessor load sequence
4.5. Coprocessor connections with bidirectional bus
4.6. Coprocessor connections with unidirectional bus
4.7. Connecting multiple coprocessors
5.1. Typical debug system
5.2. ARM7TDMI block diagram
5.3. Debug state entry
5.4. Clock switching on entry to debug state
5.5. ARM7 CPU main processor logic, TAP controller, and EmbeddedICE-RT logic
5.6. DCC control register format
7.1. General timings
7.2. ABE address control
7.3. Bidirectional data write cycle
7.4. Bidirectional data read cycle
7.5. Data bus control
7.6. Output 3-state time
7.7. Unidirectional data write cycle
7.8. Unidirectional data read cycle
7.9. Configuration pin timing
7.10. Coprocessor timing
7.11. Exception timing
7.12. Synchronous interrupt timing
7.13. Debug timing
7.14. DCC output timing
7.15. Breakpoint timing
7.16. TCK and ECLK relationship
7.17. MCLK timing
7.18. Scan general timing
7.19. Reset period timing
7.20. Output enable and disable times due to HIGHZ TAP instruction
7.21. Output enable and disable times due to data scanning
7.22. ALE address control
7.23. APE address control
B.1. ARM7TDMI core scan chain arrangements
B.2. Test access port controller state transitions
B.3. ID code register format
B.4. Output scan cell
B.5. Clock switching on entry to debug state
B.6. Debug exit sequence
B.7. EmbeddedICE-RT block diagram
B.8. Watchpoint control value and mask format
B.9. Debug control register format
B.10. Debug status register format
B.11. Debug control and status register structure
B.12. Debug abort status register

List of Tables

1.1. Key to tables
1.2. ARM instruction summary
1.3. Addressing modes
1.4. Operand 2
1.5. Fields
1.6. Condition fields
1.7. Thumb instruction set summary
2.1. Register mode identifiers
2.2. PSR mode bit values
2.3. Exception entry and exit
2.4. Exception vectors
2.5. Exception priority order
3.1. Bus cycle types
3.2. Burst types
3.3. Significant address bits
3.4. nOPC
3.5. nTRANS encoding
3.6. Tristate control of processor outputs
3.7. Read accesses
3.8. Use of nM[4:0] to indicate current processor mode
4.1. Coprocessor availability
4.2. Handshaking signals
4.3. Summary of coprocessor signaling
4.4. Mode identifier signal meanings, nTRANS
5.1. DCC register access instructions
6.1. Branch instruction cycle operations
6.2. Thumb long branch with link
6.3. Branch and exchange instruction cycle operations
6.4. Data operation instruction cycles
6.5. Multiply instruction cycle operations
6.6. Multiply accumulate instruction cycle operations
6.7. Multiply long instruction cycle operations
6.8. Multiply accumulate long instruction cycle operations
6.9. Load register instruction cycle operations
6.10. MAS[1:0] signal encoding
6.11. Store register instruction cycle operations
6.12. Load multiple registers instruction cycle operations
6.13. Store multiple registers instruction cycle operations
6.14. Data swap instruction cycle operations
6.15. Software Interrupt instruction cycle operations
6.16. Coprocessor data operation instruction cycle operations
6.17. Coprocessor data transfer instruction cycle operations
6.18. coprocessor data transfer instruction cycle operations
6.19. Coprocessor register transfer, load from coprocessor
6.20. Coprocessor register transfer, store to coprocessor
6.21. Undefined instruction cycle operations
6.22. Unexecuted instruction cycle operations
6.23. ARM instruction speed summary
7.1. General timing parameters
7.2. ABE address control timing parameters
7.3. Bidirectional data write cycle timing parameters
7.4. Bidirectional data read cycle timing parameters
7.5. Data bus control timing parameters
7.6. Output 3-state time timing parameters
7.7. Unidirectional data write cycle timing parameters
7.8. Unidirectional data read cycle timing parameters
7.9. Configuration pin timing parameters
7.10. Coprocessor timing parameters
7.11. Exception timing parameters
7.12. Synchronous interrupt timing parameters
7.13. Debug timing parameters
7.14. DCC output timing parameters
7.15. Breakpoint timing parameters
7.16. TCK and ECLK timing parameters
7.17. MCLK timing parameters
7.18. Scan general timing parameters
7.19. Reset period timing parameters
7.20. Output enable and disable timing parameters
7.21. ALE address control timing parameters
7.22. APE address control timing parameters
7.23. AC timing parameters used in this chapter
A.1. Transistor gate dimensions of the output driver for a 0.18µm process
A.2. Signal types
A.3. Signal descriptions
B.1. Public instructions
B.2. Scan chain number allocation
B.3. Scan chain 0 cells
B.4. Scan chain 1 cells
B.5. Function and mapping of EmbeddedICE-RT registers
B.6. MAS[1:0] signal encoding
B.7. Debug control register bit assignments
B.8. Interrupt signal control
B.9. Debug status register bit assignments

Proprietary Notice

Words and logos marked with ® or ™ are registered trademarks or trademarks owned by ARM Limited. Other brands and names mentioned herein may be the trademarks of their respective owners.

Neither the whole nor any part of the information contained in, or the product described in, this document may be adapted or reproduced in any material form except with the prior written permission of the copyright holder.

The product described in this document is subject to continuous developments and improvements. All particulars of the product and its use contained in this document are given by ARM in good faith. However, all warranties implied or expressed, including but not limited to implied warranties of merchantability, or fitness for purpose, are excluded.

This document is intended only to assist the reader in the use of the product. ARM Limited shall not be liable for any loss or damage arising from the use of any information in this document, or any error or omission in such information, or any incorrect use of the product.

Figure B.2 reprinted with permission IEEE Std 1149.1-1990. IEEE Standard Test Access Port and Boundary-Scan Architecture Copyright 2001, by IEEE. The IEEE disclaims any responsibility or liability resulting from the placement and use in the described manner.

Confidentiality Status

This document is Non-Confidential. The right to use, copy and disclose this document may be subject to license restrictions in accordance with the terms of the agreement entered into by ARM and the party that ARM delivered this document to.

Product Status

The information in this document is final, that is for a developed product.

Revision History
Revision A17 April 2001First release for ARM7TDMI Rev 4.
Revision B19 September 2001Maintenance update to correct minor documentation errors.
Revision C26 November 2004Maintenance update to correct minor documentation errors.
Copyright © 2001, 2004 ARM Limited. All rights reserved.ARM DDI 0210C
Non-Confidential
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