4.1. RTC test harness overview

The test harness provides integration vectors to enable:

The integration vectors provide a way of verifying that the RTC is correctly wired into a system. This is done by testing three groups of signals:

AMBA signals

These signals are tested by checking the connections of all address and data bits.

Primary input and output signals

These signals are tested using a simple trickbox that demonstrates the correct connection of the input and output signals to external pads.

Intra-chip signals

The tests for these signals are system-specific and require the necessary tests to be written. Additional logic can be implemented to allow reads and writes to each intra-chip signal.

These test features are controlled by a test register. This allows testing of the RTC in isolation from the rest of the system using only transfers from the AMBA APB.

Off-chip integration test vectors are supplied using a 32-bit parallel External Bus Interface (EBI) and converted to internal AMBA bus transfers. The application of test vectors is controlled through the Test Interface Controller (TIC) AMBA bus master module.

Figure 4.1 shows a block diagram of the RTC test harness.

Figure 4.1. RTC test harness

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