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The six test data registers that can connect between DBGTDI and DBGTDO are described in the following sections:
In the following descriptions, data is shifted during every HCLK cycle when DBGTCKEN enable is HIGH.
| Copyright © 2001, 2003, 2004 ARM Limited. All rights reserved. | ARM DDI 0229C |
| Non-Confidential | |
| PDF version | |
| Home > Debugging Your System > Test data registers |