| Copyright © 2003. All rights reserved. | ARM DDI 0291A |
| Non-Confidential | |
 PDF version | |
| Home > Programmer’s Model for Test > Scan testing |
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The ECT is designed to simplify:
insertion of scan test cells
use of Automatic Test Pattern Generation (ATPG).
This is the recommended method of manufacturing test.
| Copyright © 2003. All rights reserved. | ARM DDI 0291A |
| Non-Confidential | |
| PDF version | |
| Home > Programmer’s Model for Test > Scan testing |