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| Home > MBIST Instruction Register > Field descriptions > Control field, MBIR[52:47] |
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The control field specifies the MBIST function. Table 3.3 shows how the control field affects the behavior of the MBIST controller.
Table 3.3. Control field encoding
| Control MBIR[52:47] | Behavior | Description |
|---|---|---|
| bx00000 | Default | Test runs to completion. If MBIR[52] = 0, sticky fail present after first failure. |
| bx00001 | Stop on fail | End of test on failure. |
| bx00011 | Bitmap mode | Enables logging of each failure. See Bitmap mode. |
MBIR[52] selects a nonsticky or sticky fail flag, MBISTRESULT[1]:
When MBIR[52] is set, the fail bit toggles in real time. It goes HIGH for failing comparisons and LOW for passing comparisons.
Setting MBIR[52] can cause the fail bit to toggle at the test frequency. It is not recommended when the external pin or the ATE cannot follow the test frequency.
When MBIR[52] is cleared, the fail bit is sticky. It remains HIGH after the first failure until a new MBIST instruction shifts in or until the data log shifts out.
| Copyright © 2007 ARM Limited. All rights reserved. | ARM DDI 0402A |
| Non-Confidential | |
| PDF version | |
| Home > MBIST Instruction Register > Field descriptions > Control field, MBIR[52:47] |