3.1. About the MBIST Instruction Register

Figure 3.1 shows the bit fields of the MBIR.

Figure 3.1. MBIST Instruction Register


The MBIR fields set up the behavior of the MBIST engine:

Pattern

Specifies the test algorithm.

Control

Specifies MBIST mode of operation and sticky or nonsticky fail flag.

Write latency

Specifies the number of cycles to enable a RAM write.

Read latency

Specifies the number of cycles to enable a RAM read.

X addr

Specifies the number of bits in the X-address counter.

Y addr

Specifies the number of bits in the Y-address counter.

Data seed

Specifies the four-bit data background.

Enables

Specifies the RAM under test.

Column width

Specifies 4, 8, 16, or 32 columns per block of RAM.

Cache size

Specifies a cache size of 128KB, 256KB, 512KB, 1MB, 2MB, 4MB, or 8MB.

Way size

Specifies a way size of 16KB, 32KB, 64KB, 128KB, 256KB, or 512KB.

Parity support

Specifies if parity is supported.

Lockdown by line support

Specifies if lockdown by line is supported.

Way configuration

Specifies an 8-way or 16-way configuration.

Field descriptions describes the MBIR fields in more detail.

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