A.2.6. Scan test

Table A.7 shows the scan test signals.

Table A.7. Scan test signals

SignalTypeSourceDescription
dft_en_clk_outInputTie-offThis signal is used for Automatic Test Pattern Generator (ATPG) testing only but is only available when the DDR2 DMC is configured to provide a legacy pad interface
rst_bypassInputTie-offThis signal is used for ATPG testing only
seInputTie-offThis signal enables scan mode

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