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The test points listed in Table 3.7 enable you to measure clock frequencies and FPGA core temperature.
Table 3.7. Test points
| Test Point | Signal | Description |
|---|---|---|
| TP1 | CLK_GLOBAL_IN | Buffered version of global clock signal. This is fed to a GCLK input of the FPGA. |
| TP2 | CLK_GLOBAL_OUT | Buffered version of global clock signal from the FPGA. (This signal is driven even if CLK_GLOBAL_OUT is disabled.) |
| TP3 | CLK_24MHZ | Buffered replica of the fixed-frequency reference clock signal that feeds CLK_24MHZ_FPGA and CLK_24MHZ_PLD. |
| TP8 | CLK_OUT | Buffered version of clock signal CLK_OUT_TO_BUF that drives the buffers for the dual/differential clocking scheme:
|
| TP9 | CLK_SCLK | Buffered version of serial data input clock to programmable oscillators |
| J7 | DXP and DXN | Temperature sensing diode output. (There is not a socket fitted to the board, but you can fit a socket or measure the voltage directly from the socket pads.) |