3.8.1. CT11MPCore PLD signals

The CT11MPCore PLD performs the following functions:

Note

The binary image for the EB system FPGA depends on whether a tile is fitted in the remaining baseboard tile site. A further Core Tile or a Logic Tile may be fitted here for system prototyping. The application notes supplied include FPGA and PLD images for the current ARM supported tile combinations.

The CT11MPCore PLD is controlled by the serial interface signals listed in Table 3.4. These signals connect to the EB via the HDRZ header.

Table 3.4. PLD control signals

SignalDescription
PLDCLKClocks data into or out of the PLD
PLDD1Serial data input to PLD
PLDD0Serial data output from PLD
PLDnRESETResets the serial interface and signals the start of transfers

The EB system FPGA implements seven registers that hold values sent to and received from the CT11MPCore PLD using the 4-wire serial interface. The EB system FPGA provides the serialization and deserialization logic required for the interface. The interface timing is shown in Figure 3.14.

Figure 3.14. 4-wire serial interface timing


Data is output on the rising edge of PLDCLK and sampled on the falling edge. The interface is reset and re-synchronized by PLDnRESET after each 60 bit serial transfer. The rising edge of PLDnRESET also indicates the start of a transfer. The data is transferred MSB first in both directions across the interface.

Note

The PLDD0 serial data stream from the CT11MPCore PLD is only 43 bits long. Bits PLDD0[42:0] are used to transfer the data, PLDD0[59:43] are reserved and tied LOW.

The CT11MPCore PLD drives the configuration signals listed in Table 3.5.

Note

There are a total of 60 bits used in the Serial write data register serial data stream.

Table 3.5. Serial write data register

PLD Pin NameSerial Bits PLDD1Definition
RD_DIV[3:0]3:0

ARM11 MPCore test chip PLL Clock divider.

See Clock setting in reset mode.

RD_CTRL[31:16]19:4

ARM11 MPCore test chip PLL Clock control.

See Clock setting in reset mode.

PLLUPDATE20

Start PLL update flag (reserved for future PLL support).

L2BYPASS21

Selects the L2 cache bypassing:

  • 0: you can use the L2 cache

  • 1: the L2 cache is bypassed.

L2MASTNUM22

Selects the number of L220 master ports:

  • 0: one master port, M1. When one master is selected, master port 1 is used

  • 1: two master ports, M0 and M1 are used.

The port options available are shown in Figure 4.11.

Note

This bit is not currently user configurable and is set HIGH by the CT11MPCore PLD to select two L220 master ports when using the EB.

MPMASTNUM23

Selects the number of ARM11 MPCore test chip master ports:

  • 0: one master port, M0. When one master is selected, master port 0 is used

  • 1: two master ports, M0 and M1 are used.

The port options available are shown in Figure 4.11.

AXInOE024

AXI Mux output enable:

  • 0: enable AXI Port 0 to Y headers

  • 1: disable and isolate AXI Port 0 from Y headers.

See AXI bus multiplexing.

HDRZEN25

Header Z optional signal mux enable:

  • 0: disable optional HDRZ signals

  • 1: enable optional HDRZ signals.

See HDRZ signal mux.

VINITHI[3:0]29:26

When HIGH, indicates high-Vecs mode for the particular ARM11 MPCore processor.

CFGEND[1:0]31:30The U and EE bits reset values in the CP15 Control Register and E Bit reset value in CPSR/SPSR depend on the value of CFGEND[1:0]. See the ARM11 MPCore Processor Technical Reference Manual (ARM DDI 0360) for details.
nCPURESET[3:0]35:32Individual ARM11 MPCore processor resets.
DBGMUX[11:0]47:36

Debug matrix select. Selects the external debug request and debug acknowledge routing between the four ARM11 MPCore CPUs to enable cross-triggering.

INTMODE[2:0]50:48

Interrupt mode:

  • bx00: Legacy

  • bx01: New + DCC

  • bx1x: New no DCC

  • b1xx: FIQ[3:0] enable.

See Interrupts.

DACDAT[7:0]58:51Voltage control, 8 bit DAC value applied to the DAC channel selected by DACSEL. See Setting the ARM11 MPCore test chip voltage.
DACSEL59Selects the voltage control DAC channel. See Setting the ARM11 MPCore test chip voltage.

The CT11MPCore PLD Serial read data register provides the status signals listed in Table 3.6.

Note

There are a total of 43 bits used in the Serial read data register data stream.

Table 3.6. Read serial data register

PLD Pin NameSerial Bits PLDD0Definition
PLOCK0

ARM11 MPCore test chip PLL lock indicator.

  • 0: ARM11 MPCore test chip PLL is not locked to REFCLK

  • 1: ARM11 MPCore test chip PLL is locked to REFCLK.

See Clock setting in reset mode.

ISP0nLOCK1

ispClock5620 PLL lock indicator 0.

  • 0: ispClock5620 PLL 0 is locked to CLKOUTDIVD

  • 1: ispClock5620 PLL 0 is not locked to CLKOUTDIVD.

See Clocks.

ISP1nLOCK2

ispClock5620 PLL lock indicator 1.

  • 0: ispClock5620 PLL 1 is locked to CLKOUTDIV

  • 1: ispClock5620 PLL 1 is not locked to CLKOUTDIV.

See Clocks.

PLLUPDATED3

MPCore PLL settings status.

  • 0: ARM11 MPCore test chip PLL settings are being updated.

  • 1: ARM11 MPCore test chip PLL settings are complete.

RESETREQ[3:0]7:4

Individual watchdog reset requests, one from each ARM11 MPCore CPU

SMPnAMP[3:0]11:8

Individual AMP or SMP mode indicators, one from each MPCore CPU.

  • 0: Indicates AMP mode (processor is not part of coherency)

  • 1: Indicates SMP mode (processor is part of coherency)

See the ARM11 MPCore Processor Technical Reference Manual (ARM DDI 0360).

STANDBYWFI[3:0]15:12

Individual WFI indicators. Indicates if an MPCore CPU is in WFI state.

See the ARM MPCore Processor Technical Reference Manual (ARM DDI 0360).

COMMTX[3:0]19:16Comms channel transmit from each ARM11 MPCore CPU.
COMMRX[3:0]23:20Comms channel receive from each ARM11 MPCore CPU.
ADCDAT[11:0]35:24Current sensing 12-bit ADC value (selected by ADCSEL[2:0]).
ADCSEL[2:0]38:36ADC channel currently being converted (ADCDAT value is from ADC channel ADCSEL - 1).
PLDVER[3:0]42:39PLD build version.
Reserved59:43Legacy only (not used).

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