3.3.6. Upper DTCM test

This tests the upper portion of the DTCM, which is mapped to Altera on-chip memory. The lower portion of DTCM is used for program stack and global space, so only the upper portion of DTCM is tested. Upper DTCM locations are written with a random pattern, and these locations are then read back. This is done for 8-bit, 16-bit, and 32-bit accesses. The test only passes if the software reads back the expected data values from the DTCM.

Copyright © 2008 ARM Limited. All rights reserved.ARM DUI 0430A
Non-Confidential