Boundary scan test vectors

If you use the JTAG boundary scan test methodology to apply production test vectors, you might want to have independent external access to each Test Access Port (TAP) controller. This avoids the requirement to merge test vectors for more than one block in the device. One solution to this is to adopt a hybrid, using a pin on the package that switches elements of the device into a test mode. You can use this to break the internal daisy chaining of TDO and TDI signals, and to multiplex out independent JTAG ports on pins that are used for another purpose during normal operation.

Show/hideSee also

Copyright © 2010-2012, 2015 ARM. All rights reserved.ARM DUI 0499I