What do each of the ARM7TDMI production test patterns cover?

Applies to: ARM7TDMI

Answer

The basic breakdown of the test patterns is as follows:

'ale' Simple vectors to test the operation of the ALE pin and address generation.
'thumb' Tests the changes to the blocks which were made to the ARM7TDMI in order to make it thumb compatible (but not the instruction decompression logic itself).
'arm' Tests the ARM instruction decoder and main data path.
'debug' Tests the debug features of the core.
'ice' Tests the operation of the EmbeddedICE Macrocell.
'mul' Tests the operation of the multiplier block.
'pipe' Tests the Thumb instruction decompression logic and pipeline.
'regnew' Tests the register bank more extensively that the other vectors.
'rev4' Tests the functional changes between Rev 3A and Rev 4 (Applies to ARM7TDMI Rev 4 only).

Article last edited on: 2008-09-09 15:47:35

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