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Applies to: ARM7TDMI
Example initial configuration of the ARM7TDMI input signals:
Signal | State | Description | Remarks |
| MCLK | Driven | Memory Clock Input | Must be actively driven. If held static, processor stops without loss of state. |
| ABE | HIGH | Address Bus Enable | If HIGH, Address bus enabled. If LOW, Address bus is put in a high impedance state |
| DBE | HIGH | Data Bus Enable | If HIGH, Data bus enabled. If LOW, Data bus is put into a high impedance state |
| TBE | HIGH | Test Bus Enable | Enables data bus and address bus. Should be held HIGH under normal conditions. If LOW, Address bus, data bus, LOCK, MAS, nTRANS, nRW and nOPC are forced to high impedance state. |
| nENIN | LOW | Not Enable Input | May be used with nENOUT to control the data bus during write cycles |
| DBGEN | HIGH | Debug Enable | IMPORTANT! Must be high to allow the use of debug features and Multi-ICE or EmbeddedICE |
| DBGRQ | LOW | Debug Request | If high, the ARM7TDMI enters debug state after executing the current instruction. |
| BREAKPT | LOW | Breakpoint | If high, the current memory access is breakpointed. Should be LOW for normal execution. |
| EXTERN(1,0) | HIGH / LOW | External input | Allows breakpoints or watchpoints to be dependent on external conditions. Not used by debugger, by default. |
| CPA | HIGH | Coprocessor Absent | IMPORTANT! Should always be HIGH unless external coprocessor is present |
| CPB | HIGH | Coprocessor busy | IMPORTANT! Should always be HIGH unless external coprocessor is present. |
| ISYNC | LOW | Synchronous Interrupts | IMPORTANT! If LOW, nIRQ and nFIQ interrupts are synchronised internally by the ARM core |
| BUSEN | HIGH / LOW | Data Bus configuration | If HIGH, the unidirectional data buses are used, and the bi-directional data bus must be left unconnected. If LOW, the bi-directional data bus is used. DIN[31:0] must be tied off, and DOUT[31:0] can be left unconnected. |
| DIN[31:0] | HIGH / LOW | Data In | Tied off to either state if BUSEN is LOW and therefore the bidirectional bus is used. Driven by system if BUSEN is HIGH. |
| D[31:0] | HIGH / LOW | Bidirectional Data Bus | Used by the system if BUSEN is LOW. IMPORTANT! Has to be left unconnected if BUSEN is HIGH |
| BIGEND | HIGH / LOW | Big Endian | HIGH if system has Big Endian configuration, LOW if Little Endian configuration is used. |
| ALE | HIGH | Address Latch Enable | Used to control the transparent latches on the address bus, when reading from byte wide memory. If LOW, address is frozen. |
| APE | HIGH | Address Pipeline Enable | If HIGH allows the address bus to be pipelined, if LOW, address is put on the address bus in phase 1 of the actual cycle. |
| BL[3:0] | HIGH | Byte Latch Control | Controls when data and instructions are latched from the external data bus. If HIGH, data are latched on the falling edge of MCLK. |
| ABORT | LOW | Memory Abort | If HIGH tells the memory system that a requested access is not allowed. |
| nIRQ | HIGH | Not Interrupt Request | Must be taken LOW to interrupt the processor. Appropriate disable bit must be clear. |
| nFIQ | HIGH | Not Fast Interrupt Request | Must be taken LOW to interrupt the processor. Appropriate disable bit must be clear. |
| nWAIT | HIGH | not Wait | nWAIT is ANDed with MCLK and must only change when MCLK is LOW. Must be tied HIGH if not used |
| nRESET | LOW for Reset | not Reset | Has to be driven LOW for at least two MCLK cycles, with nWAIT held high in order to properly reset the core. |
| nTRST | LOW | not Test Reset | May be tied to LOW if debug/test logic is not to be used. Has to be connected to a pad if JTAG test methodology is used. |
| SDOUTBS | LOW | Boundary Scan Serial Output Data | Should be tied to LOW if no external scan chains are supplied. |
| TDI | HIGH | Test Data Input | Should be held HIGH if TAP controller is not active. |
| TMS | HIGH | Test Mode Select | Should be held HIGH if TAP controller is not active. |
| TCK | HIGH | Test Data Output | Should be held HIGH if TAP controller is not active. |
Article last edited on: 2008-09-09 15:47:38
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